Researchers have systematically charted a superconducting dome in thin films of strontium-doped lanthanum nickelate, ...

Researchers have demonstrated a new technique for precisely controlling phase boundaries in thin film materials by manipulating the thickness of those films – allowing them to engineer energy storage ...

A technical paper titled “Freeform direct-write and rewritable photonic integrated circuits in phase-change thin films” was published by researchers at University of Washington, University of Maryland ...

Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

Thin films form the basis of many industries today, including semiconductors, electric vehicles, smart optical coatings, sophisticated medical equipment, and protective layers on high-temperature ...